Surface inspection - offline measurement : For what purpose?
The demand for faster production and smaller dimensions, zero defects and material savings, has led CERSA to develop new high-performance gauge. Our SQM-F gauge is designed to detect defects such as scratches, die marks, dents, blisters or particles that can appear on the surface of a wire/cable/tube during the manufacturing process.
CERSA has developed a bench to use our SQM-F offline. The goal is to fix samples (from 15µm to 2000µm) straight and centered in the measuring instrument. The linear displacement is manual and provides enough movement to characterize a surface sample around 500mm long. A PC software provides tools for displaying and analyzing the image of the product surface.
Applications :
- Qualitycontrol by checking wire sample surface appearance
- Indirect die control effect by analyzing the wire drawn
- Incoming inspection (quality control)
Types of wires :
- Metallic wires with reflective surfaces (steel, copper, gold, silver, iridium, titanium,etc.)
- Enameled wires, coated wires
- Medical tubes
Instruments making up this solution
WST - SQMF : test bench
A tool specifically designed for the SQM-F to manipulate samples easily. CERSA developed a test bench to use our SQM-F offline. The goal is to fix samples (from 15µm to 2000µm) straight and centered in the measuring instrument. The linear displacement is manual and provides enough movement to characterize a surface sample of around 500mm long
SQMF
The SQMF offers high-resolution and real-time surface defect detection on fine wires, cables and tubes with 128 pixels per circumference and 200,000 images per second. The defect image is displayed on CIM soft for customer analysis and characterization. The minimum linear resolution is 18μm. 100% of the surface is covered. Its high-measurement rate help to characterize continuously fine defects in real-time and to display their images on your PC. A perfect partner for diameter measuring devices such as the LDS and DLN instruments from CERSA.
Our software solution for Surface Sample measurement
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WIRE360 software
Software developed by CERSA engineers to provide all the tools needed for taking advantage of the WIRE360 solution.
Our software offers comprehensive functions for displaying the sample surface image, for playing with parameters for detecting and displaying defects, and for recording the data to get the most out of the SQM-F off-line.
Provided as a package with the WIRE360 solution.
Our dedicated accessories
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